localizing and identifying physical defects. Scan diagnosis is an established software-based method for defect localization and is used as part of the failure-analysis process (see “Yield challenges ...

Numerous challenges have to be overcome during design and production of ICs below 90 nm. Manufacturing processes are still being characterized, and the interactions between the physical processes and ...

WILSONVILLE, Ore.--(BUSINESS WIRE)--Mentor Graphics Corporation (NASDAQ: MENT) today announced evaluation results at Fujitsu Semiconductor Ltd. that shows the Tessent ® YieldInsight ® diagnosis-driven ...

IDMs and fabless semiconductor firms are working to get high-quality products to market fast, and they have a variety of software tools to assist them. They can choose design-for-manufacture (DFM), ...

Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

It’s no secret that a successful yield ramp directly impacts integrated circuit (IC) product cost and time-to-market. Tools and techniques that help companies ramp to volume faster, while also ...