(Nanowerk News) X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult ...

Freshly dissected tissue (lower left) and its pathology-prepared slide with identified tumor regions by a pathologist (upper left), and a pseudo-color image of hyperspectral dark-field microscopy ...

Researchers from the University of Science and Technology of China (USTC) have unveiled a planar optical device that ...

Researchers from the University of Science and Technology of China (USTC) led by Prof. ZHANG Douguo have unveiled a planar optical device that significantly enhances the capabilities of dark-field ...