Abstract: This work investigates the variability effects in CMOS circuits under ionizing radiation stress. We studied two types of delay cells embedded in ring oscillators (ROSCs): a basic CMOS ...
Abstract: Currently, the power consumption is one of the major concerns in VLSI circuit design based on CMOS (Complementary Metal Oxide Semiconductor) and CNTFET (Carbon Nano Tube Field Effect ...
Aeluma's confident execution, rising commercialization, and revenue growth projections make it a compelling long-term ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback